Beckman Coulter LS 13 320 XR

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Used for characterizing particulate contaminants, catalysts, and fine particles in fluids and slurries.

Description

Key Features:

  • Advanced PIDS Technology: Incorporates Polarization Intensity Differential Scattering (PIDS) technology, which enhances the accuracy and resolution of measurements, particularly for smaller particles.  
  • Wide Measurement Range: Covers a broad particle size range, typically from 10 nm to 3500 µm, enabling analysis of a wide variety of samples.   
  • Versatile Dispersal Options: Offers various dispersion units for wet and dry samples, allowing for the analysis of a wide range of materials.   
  • High-Resolution Measurements: Provides high-resolution particle size distributions, allowing for the detection of subtle differences in particle size.   
  • User-Friendly Software: Equipped with intuitive software for easy operation, data analysis, and report generation.   
  • Robust and Reliable: Designed for demanding laboratory environments with robust construction and reliable performance.   

Benefits:

  • Improved Product Quality: Accurate particle size analysis is crucial for optimizing product performance and ensuring consistent quality.
  • Enhanced Process Control: Provides valuable data for optimizing manufacturing processes and improving product yield.   
  • Reduced Development Time: Enables faster and more efficient product development.
  • Improved Research: Provides valuable insights into the properties and behavior of materials.

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